Improved extraction of base and emitter resistance from small signal high frequency admittance measurements

Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting

Volumn , Issue , 1999, Pages 93-96

  Kloosterman, W J ^a   Paasschens, J C J ^a   Klaassen, D B M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CAPACITANCE; ELECTRIC CONDUCTANCE; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; MATRIX ALGEBRA; SIGNAL NOISE MEASUREMENT; TRANSCONDUCTANCE;

BASE RESISTANCE; CORDE IMPEDANCE METHOD; EMITTER ADMITTANCE MATRIX; EMITTER RESISTANCE; SMALL SIGNAL HIGH FREQUENCY ADMITTANCE MEASUREMENTS;

ELECTRIC ADMITTANCE;

EID: 0033281307     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)