Characterization of phase separation in mixed surfactant films by liquid tapping mode atomic force microscopy

Langmuir

Volumn 15, Issue 9, 1999, Pages 3021-3025

  Yuan, Yonghui ^a   Lenhoff, Abraham M ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIQUID TAPPING MODE ATOMIC FORCE MICROSCOPY;

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; HIGH TEMPERATURE PROPERTIES; IONIC STRENGTH; LANGMUIR BLODGETT FILMS; PHASE SEPARATION; SURFACE PROPERTIES; THERMAL EFFECTS;

SURFACE ACTIVE AGENTS;

EID: 0033279748     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la980879k     Document Type: Article

References (22)