Film structure and conductometric hydrogen-gas-sensing characteristics of ultrathin platinum films

Langmuir

Volumn 15, Issue 9, 1999, Pages 3307-3311

  Patel, Sanjay V ^b   Gland, John L ^a   Schwank, Johannes W ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON OXIDE;

CATALYSIS; DEPOSITION; HEAT TREATMENT; HYDROGEN; NITROGEN; OXIDATION; OXYGEN; PLATINUM; POSITIVE TEMPERATURE COEFFICIENT; SILICON COMPOUNDS; ULTRATHIN FILMS;

METALLIC FILMS;

EID: 0033279666     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9809426     Document Type: Article

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