Latent ESD failures in Schottky barrier diodes

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1999, Pages 160-167

  Anand, Yogi ^a   Crowe, Dana ^a  

^a M/A COM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC DISCHARGES; ELECTRONIC EQUIPMENT TESTING; ELECTROSTATICS; LEAKAGE CURRENTS; MICROWAVE DEVICES; TRANSCEIVERS;

ELECTROSTATIC DISCHARGES (ESD);

SCHOTTKY BARRIER DIODES;

EID: 0033279089     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)