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Volumn 46, Issue 5, 1999, Pages 1094-1100

Characterizing unpoled piezoelectric ceramic film by lamb-waves

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; COMPUTATIONAL METHODS; COMPUTER SIMULATION; ELASTICITY; METALLIC FILMS; MODAL ANALYSIS; POROSITY; SUBSTRATES;

EID: 0033276726     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.796115     Document Type: Article
Times cited : (5)

References (12)
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  • 2
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    • (1978) Mater. Res. Bull. , vol.13 , Issue.5 , pp. 525-536
    • Newnharn, R.E.1    Skinner, D.P.2    Cross, L.E.3
  • 3
    • 0023422705 scopus 로고
    • Effects of shape and volume fraction of closed pores on dielectric, elastic, and electromechanical properties of dielectric and piezoelectric ceramics - A theoretical approach
    • H. Banno, Effects of shape and volume fraction of closed pores on dielectric, elastic, and electromechanical properties of dielectric and piezoelectric ceramics - A theoretical approach, Cerami. Bull, vol. 66 no. 9, pp. 1332-1337, 1987.
    • (1987) Cerami. Bull , vol.66 , Issue.9 , pp. 1332-1337
    • Banno, H.1
  • 4
    • 0027628110 scopus 로고
    • Electromechanical properties of porous piezoelectric ceramics
    • M. I. Dunn and M. Taya, Electromechanical properties of porous piezoelectric ceramics, J. Amer. Ceram. Soc., vol. 76 no. 7, pp. 1697-1706, 1993.
    • (1993) J. Amer. Ceram. Soc. , vol.76 , Issue.7 , pp. 1697-1706
    • Dunn, M.I.1    Taya, M.2
  • 5
    • 0001189925 scopus 로고
    • Effects of grain shape anisotropy, porosity, and microcracks on the elastic and dielectric constants of polycrystalline piezoelectric ceramics
    • M. I. Dunn, Effects of grain shape anisotropy, porosity, and microcracks on the elastic and dielectric constants of polycrystalline piezoelectric ceramics, J. Appl. Phys., vol. 78, no. 3, 1533-1541, 1995.
    • (1995) J. Appl. Phys. , vol.78 , Issue.3 , pp. 1533-1541
    • Dunn, M.I.1
  • 6
    • 0030364265 scopus 로고    scopus 로고
    • Measurement techniques for evaluating piezoelectric thin films
    • San Antonio, TX
    • F. S. Hickernell, Measurement techniques for evaluating piezoelectric thin films, in Proc, 1996 IEEE Ultrason. Symp., San Antonio, TX, pp. 235-242.
    • Proc, 1996 IEEE Ultrason. Symp. , pp. 235-242
    • Hickernell, F.S.1
  • 7
    • 0024096225 scopus 로고    scopus 로고
    • Accurate determination of material constants of piezoelectric crystals from SAW velocity measurements
    • G. Kovacs, G. Trattnig and E. Langer, Accurate determination of material constants of piezoelectric crystals from SAW velocity measurements, in Proc. 1988 IEEE Ultrason. Symp., 269-272.
    • Proc. 1988 IEEE Ultrason. Symp. , pp. 269-272
    • Kovacs, G.1    Trattnig, G.2    Langer, E.3
  • 9
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    • A new high frequency analysis of coatings using leaky Lamb-waves
    • _, A new high frequency analysis of coatings using leaky Lamb-waves, J. Acoust. Soc. Amer., vol. 94, pp. 2954-2962, 1993.
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  • 12
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    • Elastic wave propagation in thin layers
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.