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Journal of the Physical Society of Japan

Volumn 68, Issue 12, 1999, Pages 4009-4013

Thickness dependence of carrier-electron states in doped semiconductor films

(3) Inaoka, Takeshi b Nishida, Atsushi a,b Hasegawa, Masayuki b

a MOTOROLA INC (United States)

b IWATE UNIVERSITY (Japan)

Author keywords

Carrier electron state; Local density functional calculation; Semiconductor film; Thickness dependence

Indexed keywords

EID: 0033275294 PISSN: 00319015 EISSN: None Source Type: Journal
DOI: 10.1143/JPSJ.68.4009 Document Type: Article

Times cited : (1)

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