The changes of the properties of Pt/SrBi2Ta2O9/Pt capacitors and Pt/SrBi2Ta2O9/CeO2/Si structures after post-annealing and their origin

Journal of the Korean Physical Society

Volumn 35, Issue SUPPL. 5, 1999, Pages

  Choi, Hoon Sang ^a   Shin, Dong Suk ^a   Lee, Hu Yong ^a   Kim, Yong Tae ^b   Park, Young K ^b   Choi, In Hoon ^a  

^a Korea University   (South Korea)

^b Korea Institute of Science and Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033266367     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)

1. C. A. Paz de Aroujo, J. D. Cuchiaro, L. M. McMillan, M. G. Scott and J. F. Scott, Science 347, 627 (1995).
2. H. Watanabe, T. Mihara, H. Yoshimori and C. A. Paz de Aroujo, Jpn. J. Appl. Phys. 34, 5240 (1995).
3. T. Noguchi, T. Hase and Y. Miyasaka, Jpn. J. Appl. Phys. 35, 4900 (1996).
4. D. S. Shin, H. N. Lee, C. W. Lee, Y. T. Kim and I. H. Choi, Jpn. J. Appl. Phys. 37, 5189 (1998).