Model on size/type conversion of stacking-faulted half on quenched Si(111) surface

Surface Review and Letters

Volumn 6, Issue 6, 1999, Pages 1037-1043

  Kato, T ^a   Uchibe, M ^a   Shimada, W ^b   Tochihara, H ^b  

^a FUKUOKA INSTITUTE OF TECHNOLOGY   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033262888     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X99001128     Document Type: Article

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