Two methods for solving optimization problems arising in electronic measurements and electrical engineering

SIAM Journal on Optimization

Volumn 10, Issue 1, 1999, Pages 1-21

  Sergeyev, Ya D ^a,b   Daponte, P ^c   Grimaldi, D ^a   Molinaro, A ^a  

^a UNIVERSITY OF CALABRIA   (Italy)

^b LOBACHEVSKY STATE UNIVERSITY OF NIZHNY NOVGOROD   (Russian Federation)

^c Dipto Ingegneria dell' I   (Italy)

Author keywords

Electrical engineering; Electronic measurements; Global optimization; Numerical algorithms

Indexed keywords

EID: 0033261452     PISSN: 10526234     EISSN: None     Source Type: Journal    
DOI: 10.1137/S1052623496312393     Document Type: Article

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