Photothermal measurement of the thermal parameters of volume materials and thin films by the photodeflection method

High Temperatures - High Pressures

Volumn 31, Issue 1, 1999, Pages 69-73

  Muratikov, Kyrill L ^a   Glazov, Aleksei L ^a   Walther, Heinz G ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033248780     PISSN: 00181544     EISSN: None     Source Type: Journal    
DOI: 10.1068/htec379     Document Type: Article

References (13)

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