Mass spectrometric analysis of clusters formed in laser ablation of a sample

Technical Physics

Volumn 44, Issue 9, 1999, Pages 1073-1076

  Kozlov, B N ^a   Mamyrin, B A ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033247829     PISSN: 10637842     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1259474     Document Type: Article

References (21)

1. Laser Ionization Mass Analysis, edited by A. K. Vertes, R. Gijbels, and F. Adams (Wiley, New York, 1994).
2. Yu. A. Bykovskiǐ and V. N. Nevolin, Laser Mass Spectrometry [in Russian], Energoatomizdat, Moscow (1985), 129 pp.
3. R. D. MacFarlane and D. F. Torgerson, Int. J. Mass Spectrom. Ion Phys. 21, 81 (1976).
4. F. R. Krueger, Z. Naturforsch. 38, 385 (1983).
5. I. Baranov, S. Bogdanov, A. Novikov el al., Nucl. Instrum. Methods Phys. Res. B 122, 329 (1997).
6. M. Karas, D. Bachmann, U. Bahr, and F. Hillenkamp, Int. J. Mass Spectrom. Ion Processes 78, 53 (1987).
7. B. N. Kozlov, I. I. Pilyugin, V. G. Shchebelin et al. Zh. Tekh. Fiz. 64(9), 155 (1994) Tech. Phys. 39, 944 (1994)]; B. N. Kozlov, I. I. Pilyugin, V. G. Shchebelin et al., Mikrochim. Acta 120, 111 (1995).
8. B. N. Kozlov, I. I. Pilyugin, V. G. Shchebelin et al. Zh. Tekh. Fiz. 64(9), 155 (1994) [Tech. Phys. 39, 944 (1994)]; B. N. Kozlov, I. I. Pilyugin, V. G. Shchebelin et al., Mikrochim. Acta 120, 111 (1995).
9. B. N. Kozlov, I. I. Pilyugin, V. G. Shchebelin et al. Zh. Tekh. Fiz. 64(9), 155 (1994) Tech. Phys. 39, 944 (1994)]; B. N. Kozlov, I. I. Pilyugin, V. G. Shchebelin et al., Mikrochim. Acta 120, 111 (1995).
10. H. W. Kroto, J. R. Heath, S. C. O'Brien et al., Nature (London) 318, 152 (1985).
11. O. F. Hagena, Surf. Sci. 106(1), 101 (1981).
12. C. H. Becker and J. B. Pallix, J. Appl. Phys. 64, 5152 (1989).
13. A. O'Keefe, M. M. Rass, and A. P. Baranovski, Chem. Phys. Lett. 130, 17 (1986).
14. B. N. Kozlov, S. N. Kirillov, and B. A. Mamyrin, Proc. SPIE 3093, 233 (1997).
15. R. Kelly and A. Miotello, Pulsed Laser Deposition of Thin Films, edited by D. B. Chrisey and G. K. Huber (Wiley, New York, 1994), pp. 55-87.
16. R. Kelley, J. J. Cuomo, P. A. Learly et al., Nucl. Instrum. Methods Phys. Res. B 9, 329 (1985); R. Kelly and J. E. Rothenberg, Nucl. Instrum. Methods 7/8, 755 (1985).
17. R. Kelley, J. J. Cuomo, P. A. Learly et al., Nucl. Instrum. Methods Phys. Res. B 9, 329 (1985); R. Kelly and J. E. Rothenberg, Nucl. Instrum. Methods 7/8, 755 (1985).
18. E. N. Sobol and N. G. Petrovskaya, Supercond. Sci. Technol. 6, 67 (1993); V. N. Bagratashvili, E. N. Antonov, E. N. Sobol et al., Appl. Phys. Lett. 66, 2451 (1995).
19. E. N. Sobol and N. G. Petrovskaya, Supercond. Sci. Technol. 6, 67 (1993); V. N. Bagratashvili, E. N. Antonov, E. N. Sobol et al., Appl. Phys. Lett. 66, 2451 (1995).
20. R. W. Dreifus, R. Kelly, and R. E. Walkup, Appl. Phys. Lett. 49, 1478 (1986).
21. B. N. Kozlov, V. P. Bul'chenko, and B. A. Mamyrin, Mol. Mater. 7, 99 (1996).