Time-resolved photoluminescence for diagnosis of resistance to ArF excimer laser damage to CaF2 single crystals

Journal of the Optical Society of America B: Optical Physics

Volumn 16, Issue 7, 1999, Pages 1153-1159

  Mizuguchi, Masafumi ^a   Hosono, Hideo ^a   Kawazoe, Hiroshi ^a   Ogawa, Tohru ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b SEMICONDUCTOR LEADING EDGE TECHNOLOGIES INC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL IMPURITIES; CRYSTAL ORIENTATION; EXCIMER LASERS; EXCITONS; LASER DAMAGE; LASER PULSES; LIGHT ABSORPTION; PHOTOLUMINESCENCE; SINGLE CRYSTALS;

FULL WIDTH AT HALF MAXIMUM (FWHM); SELF-TRAPPED EXCITON (STE); TRIVALENT YTTRIUM IONS;

CALCIUM COMPOUNDS;

EID: 0033246425     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.16.001153     Document Type: Article

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