Measurement error, multidimensionality, and scale shrinkage: A reply to Yen and Burket

Journal of Educational Measurement

Volumn 36, Issue 1, 1999, Pages 73-78

  Camilli, Gregory ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033245932     PISSN: 00220655     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1745-3984.1999.tb00547.x     Document Type: Review

References (18)

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