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Volumn 216, Issue 1, 1999, Pages 533-536
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Effect of annealing on defects in as-grown and γ-ray irradiated n-GaN layers
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0033242996
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/(SICI)1521-3951(199911)216:1<533::AID-PSSB533>3.0.CO;2-S Document Type: Article |
Times cited : (45)
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References (7)
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