SCOPUS 정보 검색 플랫폼

Physica Status Solidi (B) Basic Research

Volumn 216, Issue 1, 1999, Pages 171-174

Photoluminescence mapping and rutherford backscattering spectrometry of InGaN epilayers

(7) O'Donnell, K P a White, M E a Pereira, S a Wu, M F b Vantomme, A b Van Der Stricht, W c Jacobs, K c

a UNIVERSITY OF STRATHCLYDE (United Kingdom)

b UNIVERSITY OF LEUVEN (Belgium)

c GHENT UNIVERSITY (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTALLINITY; EPILAYERS; GALLIUM ALLOYS; GALLIUM NITRIDE; III-V SEMICONDUCTORS; INDIUM; PHOTOLUMINESCENCE; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR ALLOYS; SPECTROMETRY;

EXPERIMENTAL TECHNIQUES; INDIUM FRACTIONS; INGAN EPILAYERS; LINEAR RELATIONSHIPS; PHOTOLUMINESCENCE MAPPING; POOR CRYSTALLINITY; RUTHERFORD BACKSCATTERING SPECTROMETRY; STRUCTURAL CHARACTERISTICS;

INDIUM ALLOYS;

EID: 0033242871 PISSN: 03701972 EISSN: None Source Type: Journal
DOI: 10.1002/(sici)1521-3951(199911)216:1<171::aid-pssb171>3.0.co;2-%23 Document Type: Article

Times cited : (11)

References (9)

1
- 0001401146
- M. D. MCCLUSKEY, C. G. VAN DE WALLE, C. P. MASTER, L. T. ROMANO and N. M. JOHNSON, Appl. Phys. Lett. 72, 2725 (1998).
- (1998) Appl. Phys. Lett. , vol.72 , pp. 2725
- McCluskey, M.D.¹ Van De Walle, C.G.² Master, C.P.³ Romano, L.T.⁴ Johnson, N.M.⁵

2
- 0031348845
- W. VAN DER STRICHT, K. JACOBS, I. MOERMAN, P. DEMEESTER, L. CONSIDINE, E. J. THRUSH, J. A. CRAWLEY and P. RUTERANA, Mater. Res. Soc. Symp. Proc. 482, 107 (1998).
- (1998) Mater. Res. Soc. Symp. Proc. , vol.482 , pp. 107
- Van Der Stricht, W.¹ Jacobs, K.² Moerman, I.³ Demeester, P.⁴ Considine, L.⁵ Thrush, E.J.⁶ Crawley, J.A.⁷ Ruterana, P.⁸

3
- 0000735510
- M. F. WU, A. VANTOMME, S. M. HOGG, G. LANGOUCHE, W. VAN DER STRICHT, K. JACOBS and I. MOERMAN, Appl. Phys. Lett. 74, 365 (1999).
- (1999) Appl. Phys. Lett. , vol.74 , pp. 365
- Wu, M.F.¹ Vantomme, A.² Hogg, S.M.³ Langouche, G.⁴ Van Der Stricht, W.⁵ Jacobs, K.⁶ Moerman, I.⁷

4
- 0001172399
- R. W. MARTIN, P. G. MIDDLETON, K. P. O'DONNELL and W. VAN DER STRICHT, Appl. Phys. Lett. 74, 263 (1999).
- (1999) Appl. Phys. Lett. , vol.74 , pp. 263
- Martin, R.W.¹ Middleton, P.G.² O'Donnell, K.P.³ Van Der Stricht, W.⁴

5
- 0033528908
- Europ. Mater. Res. Soc., Strasbourg, 1998
- S. C. BAYLISS, P. DEMEESTER, I. FLETCHER, R. W. MARTIN, P. G. MIDDLETON, I. MOERMAN, K. P. O'DONNELL, A. SAPELKIN, C. TRAGER-COWAN, W. VAN DER STRICHT and C. YOUNG, Europ. Mater. Res. Soc., Strasbourg, 1998 and Mater. Sci. Engng. B 59, 292 (1999).
- (1999) Mater. Sci. Engng. B , vol.59 , pp. 292
- Bayliss, S.C.¹ Demeester, P.² Fletcher, I.³ Martin, R.W.⁴ Middleton, P.G.⁵ Moerman, I.⁶ O'Donnell, K.P.⁷ Sapelkin, A.⁸ Trager-Cowan, C.⁹ Van Der Stricht, W.¹⁰ Young, C.¹¹

6
- 0001094729
- I-HSIU HO and G. B. STRINGFELLOW, Appl. Phys. Lett. 69, 2701 (1996).
- (1996) Appl. Phys. Lett. , vol.69 , pp. 2701
- Ho, I.-H.¹ Stringfellow, G.B.²

7
- 3342960393
- K. P. O'DONNELL, R. W. MARTIN and P. G. MIDDLETON, Phys. Rev. Lett. 82, 237 (1999).
- (1999) Phys. Rev. Lett. , vol.82 , pp. 237
- O'Donnell, K.P.¹ Martin, R.W.² Middleton, P.G.³

8
- 85080563311
- Montpellier, July 5 to 9
- K. P. O'DONNELL, R. W. MARTIN, M. E. WHITE, J. F. W. MOSSELMANS and QIXIN GUO, 3rd Internat. Conf. Nitride Semiconductors, Montpellier, July 5 to 9, 1999; phys. stat. sol. (b) 216, 151 (1999).
- (1999) 3rd Internat. Conf. Nitride Semiconductors
- O'Donnell, K.P.¹ Martin, R.W.² White, M.E.³ Mosselmans, J.F.W.⁴ Guo, Q.⁵

9
- 0033242864
- K. P. O'DONNELL, R. W. MARTIN, M. E. WHITE, J. F. W. MOSSELMANS and QIXIN GUO, 3rd Internat. Conf. Nitride Semiconductors, Montpellier, July 5 to 9, 1999; phys. stat. sol. (b) 216, 151 (1999).
- (1999) Phys. Stat. Sol. (B) , vol.216 , pp. 151

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.