Neutron powder diffraction data for low- and high-temperature NASICON phases of LiM2(PO4)3 (M=Hf, Sn)

Powder Diffraction

Volumn 14, Issue 1, 1999, Pages 53-60

  Morin, E ^a   Le Mercier, T ^a   Quarton, M ^a   Losilla, E R ^b   Aranda, M A G ^b   Bruque, S ^b  

^a SORBONNE UNIVERSITÉ   (France)

^b UNIVERSITY OF MÁLAGA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; HAFNIUM; RIETVELD REFINEMENT;

HIGH TEMPERATURE; HIGH-TEMPERATURE PHASIS; NEUTRON POWDER DIFFRACTION DATA; NEUTRON POWDERS; REVERSIBLE PHASE TRANSITION; SPACE GROUP R3C; STRUCTURAL SKELETONS; STRUCTURE REFINEMENTS;

HAFNIUM COMPOUNDS;

EID: 0033242475     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600010320     Document Type: Article

References (24)

1. 3," J. Solid State Chem. 90, 185-193.
2. 3, " J. Mater. Sci. Lett. 11, 1705-1707.
3. 3," Solid State Ionics 62, 309-316.
4. Boilot, J. P., Collin, G., and Colomban, P. (1988). "Relation structure-fast ion conduction in the NASICON solid solution," J. Solid State Chem. 73, 160-171.
5. 3, (A=Li, Na) as electrode materials," Solid State Ionics 28-30, 419-423.
6. de Wolff, P. M. (1968). "A simplified criterion for the reliability of powder-pattern indexing," J. Appl. Crystallogr. 1, 108-109.
7. +-ion transport in skeleton structures," Mater. Res. Bull. 11, 203-220.
8. IV = Ge, Ti, Zr," Acta Chem. Scand. 22, 1822-1832.
9. 12," Mater. Res. Bull. 11, 173-182.
10. 3 (M=Ti, Zr, Hf) and related compositions," Solid State Ionics 70-71, 332-336.
11. Larson, A. C.. and von Dreele, R. B. (1994). GSAS (Program version: PC. summer 96) Report N° LA-UR-86-748, Los Alamos National Laboratory.
12. 3: Crystal structure from neutron powder diffraction," Chem. Mater. 9, 1678-1685.
13. 3, a monoclinically distorted NASICON-type structure," Chem. Mater. 6, 1790-1795.
14. 3 with NASICON-type structure," Chem. Mater. 7, 1857-1862.
15. Mighell, A. D., Hubbard, C. R., and Stalick, J. C. (1981). NBS*AIDS 83 is a development of "NBS*AIDS 80, A FORTRAN Program for Crystallographic Data Evaluation," National Bureau of Standards (U.S.), Technical Note N° 1141.
16. 3," Eur. J. Solid State Inorg. Chem. 36, 947-958.
17. 3," Mater. Res. Bull. 21, 365-371.
18. Rietveld, H. M. (1969). "A profile refinement method for nuclear and magnetic structures," J. Appl. Crystallogr. 2, 65-71.
19. Rodríguez-Carjaval, J. (1995). FULLPROF, Rietveld profile matching and integrated intensity refinement of X-ray and/or neutron data, Version 3.1.c, Laboratoire Léon Brillouin, CEA, Saclay, France.
20. 3 by thermal quenching," Solid State Ionics 62, 287-292.
21. N: A criterion for rating powder diffraction patterns and evaluating the reliability of powder-pattern indexing," J. Appl. Crystallogr. 12, 60-65.
22. 3," J. Solid State Chem. 83, 78-90.
23. Wiles, D., and Young, R. (1981). "A new computer program for Rieweld analysis of X-ray powder diffraction patterns," J. Appl. Crystallogr. 14, 149-151.
24. 3 (L=Li, Na; M,N=Ge, Sn, Ti, Zr, Hf). Synthèse et étude par diffraction X et conductivité ioniqué," J. Solid State Chem. 93, 341-349.