The crystal structure of O2+RuF6- and the nature of O2RhF6

Acta Chimica Slovenica

Volumn 46, Issue 2, 1999, Pages 141-154

  Botkovitz, Philippe ^a   Lucier, George M ^a   Rao, Ramesh P ^b   Bartlett, Neil ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033236729     PISSN: 13180207     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (23)

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12. Instrumentation at the University of California, Berkeley,College of Chemistry X-Ray Crystallographic Facility (CHEXRAY) consists of two Enraf-Nonius CAD-4 diffractometers, each equipped with a nitrogen-flow low temperature apparatus and controlled by a micro VAX II computer. Both use Enraf-Nonius software as described in the CAD4 OperationManual, Enraf-Nonius, Delft, Nov. 1977 and updated thereafter.
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16. Reflections used for azimuthal scans were located near Z = 90 ° and the intensities were measured at 10 ° increments of rotation of the crystal about the diffractometer vector.
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