Structural analysis of intrinsic defects in GaAs and AlxGa1-xAs by magnetooptically detected magnetic resonance spectroscopy

Physica Status Solidi (B) Basic Research

Volumn 216, Issue 2, 1999, Pages 817-907

  Koschnick, F K ^a   Spaeth, J M ^a  

^a UNIVERSITY OF PADERBORN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0033235549     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199912)216:2<817::AID-PSSB817>3.0.CO;2-6     Document Type: Review

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