Near-field analysis of micro-aperture surface emitting laser for high density optical data storage

Optical Review

Volumn 6, Issue 6, 1999, Pages 486-488

  Shinada, Satoshi ^a   Koyama, Fumio ^a   Suzuki, Kouichi ^a   Goto, Kenya ^b   Kenichi, Iga ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b TOKAI UNIVERSITY   (Japan)

Author keywords

2 dimensional finite element method (2 d fem); Near field optics; Optical memory; Semiconductor laser; VCSEL

Indexed keywords

EID: 0033233772     PISSN: 13406000     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10043-999-0486-5     Document Type: Article

References (5)

1. M. Ohtsu: Near-Field Nano/Atom Optics and Technology (Springer Verlag, Tokyo, 1998).
2. E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder and C.-H. Chang: Appl. Phys. Lett. 61 (1992), 142.
3. K. Goto: Jpn. J. Appl. Phys. 37 (1998) 2274.
4. F. Koyama, K. Goto and K. Iga: OECC '98, 16D1-4, 1998.
5. C. Mihalcea: NAIR/OITDA Workshop on Ultrahigh Density Data Storage, March, 1999.