In-field variability detection and spatial yield modeling for corn using digital aerial imaging

Transactions of the American Society of Agricultural Engineers

Volumn 42, Issue 6, 1999, Pages 1911-1920

  Gopalapillai, S ^a   Tian, L ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

Color infrared image; GIS; In field spatial variability; Nutrient stress; Soil type; Yield model

Indexed keywords

CROPS; GEOGRAPHIC INFORMATION SYSTEMS; INFRARED IMAGING; SOILS;

DIGITAL AERIAL IMAGING; IN-FIELD VARIABILITY DETECTION; NUTRIENT STRESS; YIELD MODEL;

AGRICULTURE;

ZEA MAYS;

EID: 0033232764     PISSN: 00012351     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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