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Volumn 12, Issue 11, 1999, Pages 897-900
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Investigation of SFQ integrated circuits using Nb fabrication technology
a a a a
a
NEC CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
LITHOGRAPHY;
LSI CIRCUITS;
MAGNETRON SPUTTERING;
NIOBIUM;
REACTIVE ION ETCHING;
SEMICONDUCTOR JUNCTIONS;
SHIFT REGISTERS;
TIMING CIRCUITS;
SINGLE FLUX QUANTUM INTEGRATED CIRCUITS;
STEPPER LITHOGRAPHY;
INTEGRATED CIRCUIT LAYOUT;
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EID: 0033226220
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/12/11/361 Document Type: Article |
Times cited : (8)
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References (8)
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