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Volumn 12, Issue 11, 1999, Pages 897-900

Investigation of SFQ integrated circuits using Nb fabrication technology

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); LITHOGRAPHY; LSI CIRCUITS; MAGNETRON SPUTTERING; NIOBIUM; REACTIVE ION ETCHING; SEMICONDUCTOR JUNCTIONS; SHIFT REGISTERS; TIMING CIRCUITS;

EID: 0033226220     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/11/361     Document Type: Article
Times cited : (8)

References (8)
  • 2
    • 0026116572 scopus 로고
    • RSFQ logic/memory family: A new Josephson-junction technology for sub-terahertz-clock-frequency digital system
    • Likharev K K and Semenov V K 1991 RSFQ logic/memory family: a new Josephson-junction technology for sub-terahertz-clock-frequency digital system IEEE Trans. Appl. Supercond. 1 3-28
    • (1991) IEEE Trans. Appl. Supercond. , vol.1 , pp. 3-28
    • Likharev, K.K.1    Semenov, V.K.2
  • 4
    • 0004890847 scopus 로고    scopus 로고
    • Fabrication technology for a high-density Josephson LSI using an electron cyclotron resonance etching technique and a bias-sputtering planarization
    • Numata H, Nagasawa S and Tahara S 1996 Fabrication technology for a high-density Josephson LSI using an electron cyclotron resonance etching technique and a bias-sputtering planarization Supercond. Sci. Technol. 9 A42-A45
    • (1996) Supercond. Sci. Technol. , vol.9
    • Numata, H.1    Nagasawa, S.2    Tahara, S.3
  • 5
    • 0008293751 scopus 로고
    • Rapid single flux quantum (RSFQ) shift register family
    • Mukhanov O A 1993 Rapid single flux quantum (RSFQ) shift register family IEEE. Trans. Appl. Supercond. 3 2578-80
    • (1993) IEEE. Trans. Appl. Supercond. , vol.3 , pp. 2578-2580
    • Mukhanov, O.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.