Time-of-flight measurement of hole mobility in aluminum (III) complexes

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 38, Issue 11 A, 1999, Pages

  Naka, Shigeki ^a   Okada, Hiroyuki ^a   Onnagawa, Hiroyoshi ^a   Kido, Junji ^b   Tsutsui, Tetsuo ^c  

^a UNIVERSITY OF TOYAMA   (Japan)

^b YAMAGATA UNIVERSITY   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; ELECTRIC FIELD EFFECTS; ORGANOMETALLICS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING FILMS; SEMICONDUCTING ORGANIC COMPOUNDS;

HOLE DRIFT MOBILITY;

OPTICAL FILMS;

EID: 0033226203     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.l1252     Document Type: Article

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