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Volumn 176, Issue 1, 1999, Pages 379-384

Growth and characterization of thick Si-doped AlGaN epilayers on sapphire substrates

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; METALLORGANIC CHEMICAL VAPOR DEPOSITION; NITRIDES; NUCLEATION; PHOTOLUMINESCENCE; RAPID THERMAL ANNEALING; SAPPHIRE; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SUBSTRATES;

EID: 0033222019     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199911)176:1<379::AID-PSSA379>3.0.CO;2-V     Document Type: Article
Times cited : (5)

References (3)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.