Current Directions in Automatic Test-Pattern Generation

Computer

Volumn 32, Issue 11, 1999, Pages 58-64

  Cheng, Kwang Ting ^a   Krstic, Angela ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST PATTERN GENERATION (ATPG);

AUTOMATIC TESTING; DESIGN FOR TESTABILITY; ELECTRIC FAULT CURRENTS; INTEGRATED CIRCUIT LAYOUT; MATHEMATICAL MODELS; PROGRAM DEBUGGING; SOFTWARE ENGINEERING;

INTEGRATED CIRCUIT TESTING;

EID: 0033221973     PISSN: 00189162     EISSN: None     Source Type: Trade Journal    
DOI: 10.1109/2.803642     Document Type: Article

References (2)

1. M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design, IEEE Press, New York, 1990.
2. K-T. Cheng, "Gate-Level Test Generation for Sequential Circuits," ACM Trans. Design Automation of Electronic Systems, Oct. 1996, pp. 405-442.