Interconnection channel capacity under crosstalk noise

IEEE Transactions on Electromagnetic Compatibility

Volumn 41, Issue 4 PART 1, 1999, Pages 361-365

  Ziv, Ofer ^a   Constable, James H ^a  

^a State University of New York at Binghamton   (United States)

Author keywords

Channel capacity; Crosstalk; Dielectric loss; Interconnection; Multiple valued logic; Noise coupling; Skin effect loss

Indexed keywords

CHANNEL CAPACITY; CROSSTALK; DIELECTRIC LOSSES; MATHEMATICAL MODELS; SKIN EFFECT;

MULTIPLE-VALUED LOGIC; NOISE COUPLING;

ELECTROMAGNETIC COMPATIBILITY;

EID: 0033220917     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.809819     Document Type: Article

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