In situ surface X-ray diffraction studies of electrochemical interfaces at a high-energy third-generation synchrotron facility

Electrochimica Acta

Volumn 45, Issue 4-5, 1999, Pages 591-599

  Etgens, V H ^a   Martins Alves, M C ^b   Tadjeddine, A ^c  

^a LMCP   (France)

^b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

^c SYNCHROTRON SOLEIL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; GOLD; INTERFACES (MATERIALS); MORPHOLOGY; PHASE TRANSITIONS; SINGLE CRYSTALS; SULFURIC ACID; X RAY CRYSTALLOGRAPHY;

SPECTRO-ELECTROCHEMICAL CELLS;

PHOTOELECTROCHEMICAL CELLS;

EID: 0033220789     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(99)00237-6     Document Type: Article

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