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Volumn 69, Issue 5, 1999, Pages 450-456
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Effect of contamination and etching on enamel bond strength of new light-cured glass ionomer cements
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Author keywords
Contamination; Light cured glass ionomer cements; Shear bond strength
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Indexed keywords
2 HYDROXYETHYL METHACRYLATE;
ACRYLIC ACID RESIN;
ALUMINUM SILICATE;
CAMPHOROQUINONE;
CARBOPOL 940;
DENTAL ALLOY;
FUJI ORTHO LC;
GLASS IONOMER;
ITACONIC ACID;
METHACRYLIC ACID DERIVATIVE;
RESIN CEMENT;
SUCCINIC ACID DERIVATIVE;
TERPENE;
WATER;
ANALYSIS OF VARIANCE;
ARTICLE;
CHEMISTRY;
COMPARATIVE STUDY;
DENTAL ACID ETCHING;
DENTAL BONDING;
ENAMEL;
HUMAN;
MECHANICAL STRESS;
ORTHODONTIC DEVICE;
SALIVA;
TIME;
ULTRASTRUCTURE;
ACID ETCHING, DENTAL;
ACRYLIC RESINS;
ALUMINUM SILICATES;
ANALYSIS OF VARIANCE;
DENTAL ALLOYS;
DENTAL BONDING;
DENTAL ENAMEL;
GLASS IONOMER CEMENTS;
HUMANS;
METHACRYLATES;
ORTHODONTIC BRACKETS;
RESIN CEMENTS;
SALIVA;
STRESS, MECHANICAL;
SUCCINATES;
TERPENES;
TIME FACTORS;
WATER;
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EID: 0033209722
PISSN: 00033219
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (15)
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References (9)
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