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Volumn 435, Issue 1-2, 1999, Pages 25-33
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The BaBar silicon vertex tracker
(119)
Bozzi, C
a
Carassiti, V
a
Cotta Ramusino, A
a
Dittongo, S
a
Folegani, M
a
Piemontese, L
a
Abbott, B K
b
Breon, A B
b
Clark, A R
b
Dow, S
b
Fan, Q
b
Goozen, F
b
Hernikl, C
b
Karcher, A
b
Kerth, L T
b
Kipnis, I
b
Luft, P
b
Luo, L
b
Nyman, M
b
Pedrali Noy, M
b
Roe, N A
b
Zizka, G
b
Barni, D
c
Brenna, E
c
Defendi, I
c
Forti, A
c
Giugni, D
c
Lanni, F
c
Palombo, F
c
Vaniev, V
c
Leona, A
d
Mandelli, E
d
Manfredi, P
d
Perazzo, A
d
Re, V
d
Angelini, C
e
Batignani, G
e
Bettarini, S
e
Bondioli, M
e
Bosi, F
e
Calderini, G
e
Carpinelli, M
e
Dutra, F
e
Forti, F
e
Gagliardi, D
e
Giorgi, M
e
Lusiani, A
e
Mammini, P
e
Morganti, M
e
Morsani, F
e
Profeti, A
e
Rama, M
e
Rizzo, G
e
Simi, G
e
Triggiani, G
e
Vitale, R
e
Burchat, P
f
Cheng, C
f
Kirkby, D
f
Meyer, T
f
Roat, C
f
Bianchi, F
g
Daudo, F
g
di Girolamo, B
g
Gamba, D
g
Giraudo, G
g
Grosso, P
g
Romero, A
g
Smol, A
g
Trapani, P
g
Zanin, D
g
Bosisio, L
h
della Ricca, G
h
Lanceri, L
h
Pompili, A
h
Poropat, P
h
Prest, M
h
Rastelli, C
h
Vallazza, E
h
Vuagnin, G
h
Hast, C
i
Potter, E P
i
Sharma, V
i
Burke, S
j
Callahan, D
j
Campagnari, C
j
Dahmes, B
j
Eppich, A
j
Hale, D
j
Hall, K
j
Hart, P
j
Kuznetsova, N
j
Kyre, S
j
Levy, S
j
Long, O
j
May, J
j
Richman, J
j
Roberts, D
j
Witherell, M
j
Beringer, J
k
Eisner, A
k
Frey, A
k
Grillo, A
k
Grothe, M
k
Johnson, R
k
Kroeger, W
k
Lockman, W
k
Rowe, W
k
Seiden, A
k
Spencer, E
k
Turri, M
k
Wilder, M
k
Charles, E
l
Elmer, P
l
Nielsen, J
l
Orejudos, W
l
Scott, I
l
Walsh, J
l
Zobernig, H
l
more..
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Author keywords
BaBar experiment; Silicon strip detectors; SVT
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Indexed keywords
ELECTRON ENERGY LEVELS;
ELEMENTARY PARTICLES;
INTEGRATED CIRCUITS;
MICROPROCESSOR CHIPS;
SILICON WAFERS;
MESONS;
SILICON VERTEX TRACKER;
PARTICLE DETECTORS;
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EID: 0033208059
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(99)00407-6
Document Type: Article
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3
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0343942511
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The Effect of Vertex Cuts on CP Reach
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A. Snyder, The Effect of Vertex Cuts on CP Reach, BaBar Note # 177, 1994.
-
(1994)
BaBar Note
, vol.177
-
-
Snyder, A.1
-
7
-
-
0343070753
-
Specifications and Quality Control Procedures of Silicon Detectors for SVT
-
G. Batignani et al., Specifications and Quality Control Procedures of Silicon Detectors for SVT, BaBar Note #312, 1996.
-
(1996)
BaBar Note
, vol.312
-
-
Batignani, G.1
-
9
-
-
0343942510
-
Specifications fo the BaBar SVT FanOuts
-
G. Della Ricca et al., Specifications fo the BaBar SVT FanOuts, BaBar Note # 376, 1997.
-
(1997)
BaBar Note
, vol.376
-
-
Della Ricca, G.1
-
10
-
-
0010991302
-
Hybrid Design of the BaBar Silicon Vertex Tracker
-
D. Giugni et al., Hybrid Design of the BaBar Silicon Vertex Tracker, BaBar Note # 240, 1995.
-
(1995)
BaBar Note
, vol.240
-
-
Giugni, D.1
-
12
-
-
0343942509
-
Pre production AToM chip radiation test
-
E. Mandelli, A. Perazzo, Pre production AToM chip radiation test, BaBar Note # 435, 1998.
-
(1998)
BaBar Note
, vol.435
-
-
Mandelli, E.1
Perazzo, A.2
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