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Volumn 206, Issue 1-2, 1999, Pages 23-26

Study on silicon melt convection during the RF-FZ crystal growth process. I. Experimental flow visualization

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTROMAGNETIC FIELD EFFECTS; FLOW VISUALIZATION; HEAT CONVECTION; MELTING; SILICON; VELOCIMETERS; VELOCITY MEASUREMENT; X RAY RADIOGRAPHY;

EID: 0033207887     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00319-X     Document Type: Article
Times cited : (12)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.