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Volumn 206, Issue 1-2, 1999, Pages 23-26
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Study on silicon melt convection during the RF-FZ crystal growth process. I. Experimental flow visualization
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL DEFECTS;
ELECTROMAGNETIC FIELD EFFECTS;
FLOW VISUALIZATION;
HEAT CONVECTION;
MELTING;
SILICON;
VELOCIMETERS;
VELOCITY MEASUREMENT;
X RAY RADIOGRAPHY;
FLOATING ZONE;
PARTICLE TRACKING VELOCIMETRY;
RADIO FREQUENCY HEATING;
SILICON MELT CONVECTION;
CRYSTAL GROWTH FROM MELT;
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EID: 0033207887
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(99)00319-X Document Type: Article |
Times cited : (12)
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References (11)
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