On the yield of VLSI processors with on-chip CPU cache

IEEE Transactions on Computers

Volumn 48, Issue 10, 1999, Pages 1138-1144

  Nikolos, D ^a,b   Vergos, H T ^b  

^a IEEE   (Greece)

^b UNIVERSITY OF PATRAS   (Greece)

Author keywords

Fault tolerance; On chip CPU caches; Partially good chips; Yield enhancement

Indexed keywords

BENCHMARKING; BUFFER STORAGE; MICROPROCESSOR CHIPS; RESPONSE TIME (COMPUTER SYSTEMS); STORAGE ALLOCATION (COMPUTER); VLSI CIRCUITS;

FAULTY CACHE BLOCKS; ON-CHIP CACHES;

FAULT TOLERANT COMPUTER SYSTEMS;

EID: 0033204755     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.805163     Document Type: Article

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