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Volumn 55, Issue 10, 1999, Pages 19-26

Condition-based monitoring using Energy Dispersive X-Ray Fluorescence

Author keywords

Atomic emission; Condition monitoring; Energy Dispersive X Ray Fluorescence (EDXRF); Oil analysis; Wear metal analysis

Indexed keywords

EMISSION SPECTROSCOPY; FILTRATION; FLUORESCENCE; LUBRICANTS; MONITORING;

EID: 0033201434     PISSN: 00247154     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Conference Paper
Times cited : (3)

References (11)
  • 4
    • 0028410741 scopus 로고    scopus 로고
    • Development of computer-aided image analysis for filter debris analysis
    • Yeung, K. K., McKenzie, A. J., Liew, D. and Luoma, G. A., "Development of Computer-Aided Image Analysis for Filter Debris Analysis," Lubr. Eng., 50, 4, p 293.
    • Lubr. Eng. , vol.50 , Issue.4 , pp. 293
    • Yeung, K.K.1    McKenzie, A.J.2    Liew, D.3    Luoma, G.A.4
  • 8
    • 0342306637 scopus 로고    scopus 로고
    • Sentry Ecolink Chemical Co., Stone Mountain, Georgia
    • Electron Solvent, Sentry Ecolink Chemical Co., Stone Mountain, Georgia.
    • Electron Solvent


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.