Use of an ellipsoid model for the determination of average crystallite shape and size in polycrystalline samples

Powder Diffraction

Volumn 14, Issue 3, 1999, Pages 203-207

  Žunić, Tonči Balić ^a   Dohrup, Jesper ^b  

^a UNIVERSITY OF COPENHAGEN   (Denmark)

^b HALDOR TOPSØE A S   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SYMMETRY; DIFFRACTION; EIGENVALUES AND EIGENFUNCTIONS; TENSORS; VECTORS;

CRYSTALLITE SHAPES; DIFFRACTION VECTORS; DIRECTION COSINE; EIGENVALUES AND -VECTORS; POLYCRYSTALLINE SAMPLES; POWDER DIFFRACTION; SYMMETRIC TENSORS; WHOLE-PATTERN FITTING;

CRYSTALLITE SIZE;

EID: 0033196478     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/s0885715600010538     Document Type: Article

References (16)

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