Growth and microstructural characterization of SnSe-SnSe2 composite

Journal of Materials Science

Volumn 34, Issue 18, 1999, Pages 4607-4612

  Aguiar, M R ^a   Caram, R ^a   Oliveira, M F ^b   Kiminami, C S ^b  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b FEDERAL UNIVERSITY OF SÃO CARLOS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COMPOSITION; CRYSTAL GROWTH; CRYSTAL MICROSTRUCTURE; EUTECTICS; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SOLIDIFICATION; TIN ALLOYS; X RAY DIFFRACTION ANALYSIS;

BRIDGMAN-STOCKBARGER MODEL; IN SITU COMPOSITE; TIN DISELENIDE; TIN SELENIUM ALLOYS;

COMPOSITE MATERIALS;

EID: 0033189601     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1004634615701     Document Type: Article

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