Empirical performance evaluation of graphics recognition systems

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 21, Issue 9, 1999, Pages 849-870

  Phillips, Ihsin T ^a   Chhabra, Atul K ^a  

^a SEATTLE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; BENCHMARKING; COMPUTER SOFTWARE; DRAWING (GRAPHICS); PATTERN MATCHING; PERFORMANCE;

ENGINEERING DRAWING; GRAPHICAL ENTITIES; GRAPHICS RECOGNITION SYSTEMS; VECTORIZATION SOFTWARE PACKAGES;

IMAGE ANALYSIS;

EID: 0033188880     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.790427     Document Type: Article

References (28)

1. B. Kong, I. Phillips, R. Haralick, A. Prasad, and R. Kasturi, "A Benchmark: Performance Evaluation of Dashed Line Detection Algorithms," Graphics Recognition: Methods and Applications, First Int'l Workshop, Selected Papers, R. Kasturi and K. Tombre, eds., pp. 270-285, Lecture Notes in Computer Science, vol. 1072. Berlin: Springer-Verlag, 1996.
2. O. Hori and S. Doermann, "Quantitative Measurement of the Performance of Raster-to-Vector Conversion Algorithms," Graphics Recognition: Methods and Applications, First Int'l Workshop, Selected Papers, R. Kasturi and K. Tombre, eds., pp. 57-68, Lecture Notes in Computer Science, vol. 1072. Berlin: Springer-Verlag, 1996.
3. L. Wenyin and D. Dori, "A Protocol for Performance Evaluation of Line Detection Algorithms," Machine Vision and Applications, vol. 9, nos. 5/6, pp. 240-250, 1997.
4. L. Wenyin and D. Dori, "A Proposed Scheme for Performance Evaluation of Graphics/Text Separation Algorithms," K. Tombre and A. Chhabra, eds., Graphics Recognition: Algorithms and Systems, Second Int'l Workshop, GREC '97, Selected Papers, pp. 359-371, Lecture Notes in Computer Science, vol. 1389. Berlin: Springer-Verlag, 1998.
5. R. Kasturi and I. Phillips, "The First International Graphics Recognition Contest - Dashed-Line Recognition Competition," Graphics Recognition: Methods and Applications, First Int'l Workshop, Selected Papers, R. Kasturi and K. Tombre, eds., Lecture Notes in Computer Science, vol. 1072. Berlin: Springer-Verlag, 1996.
6. A. Chhabra and I. Phillips, "Web Page for the Second International Graphics Recognition Contest - Raster to Vector Conversion," http://graphics. basit. com/iapr-tc10/contests/ contest97/.
7. I/Vector (Vectory) ver. 3.8 Raster to Vector Conversion Software, Graphikon, Berlin, Germany, and IDEAL Scanners & Systems, Rockville, Md., http://www. graphikon.com and http://www. ideal.com.
8. VPstudio ver. 6 rev. 2 Raster to Vector Conversion Software, Softelec, Munich, Germany, and Austin, Tex., http://www. softelec.com and http://www. hybridcad.com.
9. L. Wenyin and D. Dori, "Automated CAD Conversion with the Machine Drawing Understanding System," Proc. IAPR Workshop Document Analysis Systems, pp. 241-259, Malvern, Pa., Oct. 1996, ftp://ftp. technion.ac. il/pub/supported/ie/dori/MDUS/sunmdus.gz.
10. ECVNet, "Benchmarking and Performance Evaluation Web Site," http://pandora.imag.fr/ECVNet/benchmarking.html.
11. R. Haralick, "Performance Characterization in Image Analysis: Thinning, a Case in Point," Pattern Recognition Letters, vol. 13, pp. 5-12, 1992.
12. D. Dori, "Object-Process Analysis Maintaining the Balance between System Structure and Behavior," Logic and Computation, vol. 5, no. 2, pp. 227-249, 1995.
13. D. Dori, "Representing Pattern Recognition-Embedded Systems Through Object-Process Diagrams: The Case of the Machine Drawing Understanding System," Pattern Recognition Letters, vol. 16, no. 4, pp. 377-384, 1995.
14. J. O'Rourke, Computational Geometry in C. Cambridge, U.K.: Cambridge Univ. Press, 1994. Source code available at ftp:// grendel.csc.smith.edu/pub/compgeom.
15. VOGLE, a public domain device portable graphics library, ftp:// munnari.oz.au/pub/graphics/vogle.tar.gz.
16. S. Leffler and Silicon Graphics, Inc. "TIFF Software Distribution," ftp://ftp.sgi.com/graphics/tiff/tiff-v3.4beta036-tar.gz.
17. D. Knuth, "The Portable Random Number Generator," http:// www-cs-faculty.stanford.edu/knuth/programs.html. Also published in The Art of Computer Programming, Vol. 2/Seminumerical Algorithms, third ed., section 3.6. Reading, Mass.: Addison-Wesley, 1997.
18. A. Chhabra and I. Phillips, "A Benchmark for Graphics Recognition Systems," Empirical Evaluation Techniques in Computer Vision, K. Bowyer and P.J. Phillips, eds., pp. 28-44, 1998.
19. I. Phillips, "Users' Reference Manual," CD-ROM, UW-III Document Image Database-III.
20. Autodesk, Inc., AutoCAD Release 13 Customization Guide, 1995.
21. H. Baird, "Document Defect Models," Proc. IAPR Workshop Syntactic and Structural Pattern Recognition (SSPR '90), pp. 38-46, Murray Hill, N.J., June 1990.
22. T. Kanungo, R.M. Haralick, and I.T. Phillips, "Nonlinear Local and Global Document Degradation Models," Int'l J. Imaging Systems and Technology, vol. 5, no. 4, pp. 220-230, Fall 1994.
23. T. Kanungo, "Document Degradation Models and a Methodology for Degradation Model Validation," PhD thesis, Univ. of Washington, Seattle, 1996.
24. A. Chhabra and I. Phillips, "The Second International Graphics Recognition Contest - Raster to Vector Conversion: A Report," Graphics Recognition: Algorithms and Systems, Second Int'l Workshop, GREC '97, Selected Papers, pp. 390-410, Lecture Notes in Computer Science, vol. 1389. Berlin: Springer-Verlag, 1998.
25. I. Phillips, J. Liang, A. Chhabra, and R. Haralick, "A Performance Evaluation Protocol for Graphics Recognition Systems," Graphics Recognition: Algorithms and Systems, Second Int'l Workshop, GREC '97, Selected Papers, pp. 372-389, Lecture Notes in Computer Science, vol. 1389. Berlin: Springer-Verlag, 1998.
26. D. Dori, "Arc Segmentation in the Machine Drawing Understanding Environment," IEEE Trans. Pattern Analysis and Machine Intelligence, vol. 17, no. 11, pp. 1,057-1,068, Nov. 1995.
27. D. Dori and L. Wenyin, "Stepwise Recovery of Arc Segmentation in Complex Line Environents," Int'l J. Document Analysis and Recognition, vol. 1, no. 1, pp. 62-71, 1998.
28. J.P. Egan, Signal Detection Theory and ROC Analysis. New York: Academic Press, 1975.