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Volumn 9 pt 2, Issue 8, 1999, Pages
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Volatile surfactant assisted MOCVD of oxide materials
a a a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPOSITION;
CRYSTAL STRUCTURE;
ENERGY DISPERSIVE SPECTROSCOPY;
EPITAXIAL GROWTH;
HIGH RESOLUTION ELECTRON MICROSCOPY;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MORPHOLOGY;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SURFACE ACTIVE AGENTS;
SURFACE STRUCTURE;
X RAY DIFFRACTION ANALYSIS;
CRYSTALLINITY;
VOLATILE SURFACTANT;
OXIDES;
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EID: 0033188017
PISSN: 11554339
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1051/jp4:1999889 Document Type: Article |
Times cited : (4)
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References (14)
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