Closed analytical solution of breakdown voltage for planar junction and lateral curvature effect

Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors

Volumn 20, Issue 9, 1999, Pages 753-758

  He, Jin ^a   Wang, Xin ^a   Chen, Xingbi ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

NUMERICAL ANALYSIS; THEORY; VOLTAGE MEASUREMENT;

BREAKDOWN VOLTAGE; PLANAR JUNCTIONS;

SEMICONDUCTOR JUNCTIONS;

EID: 0033187640     PISSN: 02534177     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)