Enhanced exchange biasing in ion-beam sputtered bottom spin-valve films

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 2, 1999, Pages 3913-3915

  Mao, M ^a   Funada, S ^a   Hung, C Y ^a   Schneider, T ^a   Miller, M ^a   Tong, H C ^a   Qian, C ^a   Miloslavsky Read Rite, L ^a  

^a Research Corporation   (United States)

Author keywords

Bottom spinvalve; Exchange bias; Ion beam deposition; Irmn; Underlayer

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; COBALT ALLOYS; COPPER; CRYSTAL ORIENTATION; FERROMAGNETIC MATERIALS; ION BEAMS; IRIDIUM ALLOYS; NICKEL ALLOYS; SPUTTER DEPOSITION; TANTALUM; TEXTURES;

BOTTOM SPIN-VALVE FILMS; EXCHANGE BIAS; ION BEAM DEPOSITION;

MAGNETIC FILMS;

EID: 0033184365     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800706     Document Type: Article

References (5)

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