In-situ conductance measurement of surface specularity of NiFe, Co, Cu, Ag and Ta thin films

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 1, 1999, Pages 2979-2981

  Yamada, Kenichiro ^a   Bailey, William E ^a   Féry, Christophe ^a   Wang, Shan X ^a  

^a Stanford University   (United States)

Author keywords

Giant magnetoresistance; In situ conductance measurement; Magnetic film; Specularity; Spin valve

Indexed keywords

COBALT; COPPER; ELECTRIC CONDUCTANCE; MAGNETORESISTANCE; MATHEMATICAL MODELS; NICKEL ALLOYS; NICKEL COMPOUNDS; SILICA; SILVER; SURFACE ROUGHNESS; TANTALUM;

FUCHS-NAMBA MODEL; SURFACE SPECULARITY;

MAGNETIC THIN FILMS;

EID: 0033184209     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.801053     Document Type: Article

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