An accelerated test for cobalt migration in thin-film rigid disks

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 1, 1999, Pages 2703-2705

  Lin, Moon Sun ^a   Tsai, Changdar ^a   Sun, Yachun ^a   Huang, Ward ^a   Wang, C M ^a   Dong, Charles ^a  

^a Trace Storage Technology Corp   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; COBALT; ENVIRONMENTAL TESTING; MAGNETIC RECORDING; SCANNING ELECTRON MICROSCOPY;

ACCELERATED DIRECT EXTRACTION TESTS; COBALT MIGRATION; THIN FILM RIGID DISKS;

MAGNETIC THIN FILMS;

EID: 0033184187     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800958     Document Type: Article

References (3)

1. B. Bhushan, Tribology and Mechanics of Magnetic Storage Devices, 499-504 (1990).
2. L.J. Huang, et al., IEEE Trans Mag., vol. 33, 3154-3156 (1997).
3. V. Novotny, et al., IEEE Trans. Mag., vol. 23, 3645-3647 (1987).