Tribological characteristics of sinx films

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 1, 1999, Pages 2358-2360

  Wen, Jianming ^a   Ying, Xiao ^a   Wong, King ^a   Barth, Gunter ^b   Chen, Galane ^b  

^a Quinta Corporation   (United States)

^b SEAGATE TECHNOLOGY   (United States)

Author keywords

Sinx; Tribology

Indexed keywords

AMORPHOUS FILMS; DURABILITY; MAGNETIC DISK STORAGE; MAGNETIC HEADS; PRESSURE EFFECTS; SIGNAL TO NOISE RATIO; SILICON NITRIDE; SPUTTER DEPOSITION; THICK FILMS; TRIBOLOGY; X RAY PHOTOELECTRON SPECTROSCOPY;

CONTACT-START-STOP (CSS) TESTERS;

MAGNETIC FILM STORAGE;

EID: 0033184185     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800824     Document Type: Article

References (6)

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