Effect of slider load on the wear debris contamination tendency of head/slider

IEEE Transactions on Magnetics

Volumn 35, Issue 5 PART 1, 1999, Pages 2355-2357

  Cha, Kum Hwan ^a   Chung, Koo Hyun ^a   Kim, Dae Eun ^a  

^a Yonsei University   (South Korea)

Author keywords

Contamination; Drag test; Head disk interface; Wear debris

Indexed keywords

DRAG; INTERFACES (MATERIALS); MAGNETIC HEADS; SILICON; WEAR OF MATERIALS;

DRAG TEST; SLIDERS; WEAR DEBRIS;

MAGNETIC DISK STORAGE;

EID: 0033184032     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/20.800823     Document Type: Article

References (8)

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