Synthesis and structure of tris[2-(1-naphthalenyloxy)ethyl]amine and tris[2-(1-naphthalenyloxy)ethyl]amine perchlorate

Journal of Chemical Crystallography

Volumn 29, Issue 8, 1999, Pages 943-947

  Jiang, Li Jian ^a   Pan, Zhi Qian ^a   Duan, Chun Ying ^a   Luo, Qin Hui ^a   Liu, Yong Jiang ^a   Huang, Xiao Yin ^b   Wu, Qiang Jin ^b  

^a NANJING UNIVERSITY   (China)

^b FUJIAN INSTITUTE OF RESEARCH ON THE STRUCTURE OF MATTER   (China)

Author keywords

Fluorenscence; Naphthlene; Podands; Trigonal ligands

Indexed keywords

EID: 0033177398     PISSN: 10741542     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1009534213892     Document Type: Article

References (17)

1. Raguse, B., Ridley, D.D. Aust. J. Chem. 1984, 37, 2059.
2. Tsushima, S.; Takatani, M.; Nishikawa, K. Eur. Pat. Appl. EP 301, 751, 1989.
3. Turanov, A.N.; Baulin, V.E.; Kharitonvo, A.V.; Tsretkov, E.N. Zh. Neorg. Khim. 1994, 39, 1394.
4. Yakshin, V.V.; Vilkova, O.M.; Makarova, L.T.; Tsarenko, N.A.; Laskorin, B.N. Dokl. Akad. Nauk. 1992, 332, 740.
5. Turanov, A.N.; Karandashev, V.K.; Baulin, V.E.; Tsvetkov, E.N. Radiokhimiya 1995, 37, 140.
6. Minakata, S.; Itoh, S.; Komatsu, M.; Ohshiro, Y. Bull. Chem. Soc. Jpn. 1992, 65, 2992.
7. Landini, D.; Maia, A.; Maccioni, A.; Podda, G. Polym. Mater. Sci. Eng. 1993, 69, 476.
8. Tsukube, H.; Uenishi, J.; Kojima, N.; Yonemitsu, O. Tetrahedron Lett. 1995, 36, 2257.
9. Mishra, D.; Sharma, U. J. Surf. Sci. Technol. 1993, 9, 1.
10. Zhdanov, Yu.A.; Alekseev, Yu.E.; Aledseeva, V.G. Vysokomol Soedin. Ser. A. 1993, 55, 1436.
11. Kimura, E.; Young, S.; Collman, J.P. Inorg. Chem. 1970, 9, 118.
12. Enraf-Nonius CAD4 Operations Manual; Enraf-Nonius, Delft: The Netherlands, 1977.
13. Cromer, D.T.; Waber, J.T. International Tables for X-ray Crystallography, Vol. IV, Tables 2.2 A, 2.3.1.; Birmingham Kynoch, 1974.
14. Moleculer Structure Corporation. TEXSAN, TEXRAY Structure Analysis Package, Revised, MSC, 3200A; Research Forest Drive, The Woodlands, 1987.
15. Siemens. XSCANS. User's Manual Version 2.1; Siemens Analytical X-Ray Instruments Inc., Madison, WI, 1994.
16. Siemens, SHELXTL. Reference Manual, Version 5.0; Siemens Industrial Automation, Inc. Analytical Instrumentation, 1995.
17. Chand, D.K.; Bharadwaj, P.K. Inorg. Chem. 1996, 35, 3380.