Crystal structure and ionic conductivity in Bi2O3-rich Bi2O3-Ta2O5 sintered oxides

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 8 B, 1999, Pages 4838-4842

  Saito, Takashi ^a   Miida, Rokuro ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Arrhenius plot; Fluorite structure; Ionic conductivity; X ray diffraction; Bi2O3

Indexed keywords

COOLING; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY MEASUREMENT; IONIC CONDUCTION IN SOLIDS; PHASE COMPOSITION; QUENCHING; SEMICONDUCTOR GROWTH; SINTERING; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

ARRHENIUS PLOT; ATOMIC ORDERING; BISMUTH SESQUIOXIDE; FLUORITE STRUCTURE; LATTICE MODULATIONS;

SEMICONDUCTING BISMUTH COMPOUNDS;

EID: 0033175274     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.4838     Document Type: Article

References (5)

1. G. Gattow and H. Schroder: Z. Anorg. Allg. Chem. 318 (1962) 176
2. H. A. Harwig: Z. Anorg. Allg. Chem. 444 (1978) 151
3. J. W. Mendemach and R. L. Snyder: J. Am. Ceram. Soc. 61 (1978) 494
4. T. Takahashi, H. Iwahara and T. Esaka: J. Electrochem. Soc. 124 (1977) 1563
5. T. Takahashi and H. Iwahara: Maler. Res. Bull. 13 (1978) 1447