Determination of the adhesive force of molecular deposition film on silica surface by atomic force microscopy

Journal of the University of Petroleum, China (Natural Science Edition)

Volumn 23, Issue 4, 1999, Pages 53-55

  Wang, Deguo ^a   Gao, Manglai ^b   Zhang, Siwei ^b  

^a CHINA UNIVERSITY OF PETROLEUM   (China)

^b NONE

Author keywords

Adhesive force; Atomic force microscopy; Formula; Measurement; Molecular deposition film; Silica

Indexed keywords

ADHESIVES; FILMS;

ATOMIC FORCE MICROSCOPY; MOLECULAR DEPOSITION FILM;

SILICA;

EID: 0033172274     PISSN: 10005870     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. Binning G,. Quate C F and Gerber Ch. Atomic force microseope[J]. Phys. Rev. Lett., 1986,56:930-933.
2. Bharat B. Handbook of micro/nanotribology[M]. CRC Press Inc., 1995.
3. Liu Yihan, Wu Tong and Evans D F. Later force microscopy study on the shear properties of self-assembled monolayers of dialkylammonium surfactant on mica [J]. Langmuir, 1994,10: 2241-2245.
4. Liu E, Blanpain B and Celis J P. Calibration procedures for frictional measurements with a lateral force microscope [J]. Wear, 1996,192:141-150.
5. Johnson K L, Kendall K and Roberts A D. Surface energy and the contact of elastic solids[J]. London: Proc. R. Soc., 1971, Ser A324.