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Volumn 20, Issue 8, 1999, Pages 644-649
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Study of d.c. reactive sputtering deposition AlN films used for GaAs MESFET passivation
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Author keywords
[No Author keywords available]
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Indexed keywords
SEMICONDUCTING ALUMINUM COMPOUNDS;
SPUTTERING;
ALUMINUM NITRIDE FILMS;
MESFET PASSIVATION;
SEMICONDUCTING GALLIUM ARSENIDE;
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EID: 0033171655
PISSN: 02534177
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (14)
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