A one-pass algorithm for local symmetry of contours from chain codes

Pattern Recognition

Volumn 32, Issue 7, 1999, Pages 1203-1210

  Shih, Frank Y ^a   Wong, Wai Tak ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Chain code; Contour; Image processing; Parallel; Representation; Symmetry

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; EDGE DETECTION; FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE SEGMENTATION; PARALLEL PROCESSING SYSTEMS;

BINARY IMAGE; CHAIN CODES; LOCAL SYMMETRY DEFICIENCY;

IMAGE CODING;

ALGORITHM; IMAGE ANALYSIS;

EID: 0033166993     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0031-3203(98)00158-7     Document Type: Article

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