Structure of an inclusion compound of 28,28,35,35-tetramethyl-11-oxo-1,4,18,21-tetraoxa[4,1,4,1,1]paracyclophane with para-xylene

Journal of Inclusion Phenomena

Volumn 34, Issue 3, 1999, Pages 267-276

  Jones, Peter G ^a   Kuś, Piotr ^b  

^a TECHNICAL UNIVERSITY OF BRAUNSCHWEIG   (Germany)

^b UNIVERSITY OF SILESIA   (Poland)

Author keywords

Clathrate; Crystal structure; Preparation; Tetraoxaparacyclophane complex

Indexed keywords

EID: 0033165253     PISSN: 09230750     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008085829837     Document Type: Article

References (13)

1. 1. K. Krieger and F. Diederich: Chem. Ber. 118, 3620 (1985).
2. 2. J. Ratilainen, K. Airola, M. Nieger, M. Böhmer, J. Huuskonen, and K. Rissanen: Chem. Eur. J. 3, 749 (1997).
3. 3. N. K. Dalley, X. Kou, R. A. Bartsch, B. P. Czech, and P. Kus: J. Incl. Phenom. 29, 323 (1997).
4. 4. K. Odashima, A. Itai, Y. Iitaka, and K. Koga: J. Am. Chem. Soc. 102, 2504 (1980).
5. 5. K. Odashima, A. Itai, Y. Iitaka, Y. Arata, and K. Koga: Tetrahedron Lett. 21, 4347 (1980).
6. 6. I. Tabushi, K. Yamamura, H. Nonoguchi, K. Hirotsu, and T. Higuchi: J. Am. Chem. Soc. 106, 2621 (1984).
7. 7. H. Nonoguchi, K. Yamamura, I. Tabushi, T. Higuchi, and K. Hirotsu: Bull. Chem. Soc. Jpn. 65, 805 (1992).
8. 8. T. Takemura, K. Kozawa, T. Uchida, and N. Mori: Chem. Lett. 1984, 1839.
9. 9. Stoe et Cie., Darmstadt, Germany: Diffractometer control software.
10. 10. G. M. Sheldrick, Acta Crystallogr. A46, 467 (1990).
11. 11. G.M. Sheldrick, SHELXL93, a program for refining crystal structures, University of Göttingen, Germany (1993).
12. 12. Siemens. XP, molecular graphics program, version 5.03. Siemens Analytical X-ray Instruments, Madison, USA (1994).
13. 13. We have synthesized other tetraoxaparacyclophanes, and will report on them elsewhere.