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Volumn 31, Issue 3, 1999, Pages 301-308

Transforming the exponential for SPC applications

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; DATA REDUCTION; PROBABILITY DISTRIBUTIONS; STATISTICAL PROCESS CONTROL;

EID: 0033154346     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.1999.11979928     Document Type: Article
Times cited : (33)

References (11)
  • 5
    • 0022060247 scopus 로고
    • Counted data CUSUM's
    • LUCAS, J. M. (1985). "Counted Data CUSUM's". Technometrics 27, pp. 129-144.
    • (1985) Technometrics , vol.27 , pp. 129-144
    • Lucas, J.M.1
  • 7
    • 0021514376 scopus 로고
    • The Shewhart control chart - Test for special causes
    • NELSON, L. S. (1984). "The Shewhart Control Chart - Test for Special Causes". Journal of Quality Technology 16, pp. 237 239.
    • (1984) Journal of Quality Technology , vol.16 , pp. 237-239
    • Nelson, L.S.1
  • 8
    • 0028468202 scopus 로고
    • A control chart for parts per million nonconforming items
    • NELSON, L. S. (1994). "A Control Chart for Parts per Million Nonconforming Items". Journal of Quality Technology 26, pp. 239-240.
    • (1994) Journal of Quality Technology , vol.26 , pp. 239-240
    • Nelson, L.S.1
  • 9
    • 0001535569 scopus 로고
    • Power transformations to symmetry
    • TAYLOR, J. M. G. (1985). "Power Transformations to Symmetry". Biometrika 72, pp. 145-153.
    • (1985) Biometrika , vol.72 , pp. 145-153
    • Taylor, J.M.G.1
  • 11
    • 0345101262 scopus 로고    scopus 로고
    • Poisson CUSUM versus c-chart for defect data
    • WHITE, C. L.; KEATS, J. B.; and STANLEY, J. (1997). "Poisson CUSUM Versus c-Chart for Defect Data". Quality Engineering 9, pp. 673-679.
    • (1997) Quality Engineering , vol.9 , pp. 673-679
    • White, C.L.1    Keats, J.B.2    Stanley, J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.