The effects of autocorrelation and outliers on two-sided tolerance limits

Journal of Quality Technology

Volumn 31, Issue 3, 1999, Pages 286-300

  Amin, Raid W ^a   Lee, S J ^a  

^a UNIVERSITY OF WEST FLORIDA   (United States)

Author keywords

Autoregressive first order process; Correlated data; Nonnormality; Tolerance limits

Indexed keywords

CORRELATION METHODS; FITS AND TOLERANCES; PROCESS ENGINEERING; REGRESSION ANALYSIS; STANDARDS; STATISTICAL PROCESS CONTROL;

AUTOCORRELATION PROCESS; FIRST-ORDER AUTOREGRESSIVE PROCESS; OUTLIERS; TWO-SIDED TOLERANCE LIMITS;

QUALITY CONTROL;

EID: 0033154343     PISSN: 00224065     EISSN: None     Source Type: Journal    
DOI: 10.1080/00224065.1999.11979927     Document Type: Article

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