메뉴 건너뛰기




Volumn 203, Issue 4, 1999, Pages 500-510

Measurement of temperature fluctuations and microscopic growth rates in a silicon floating zone under microgravity

Author keywords

[No Author keywords available]

Indexed keywords

ANTIMONY; DOPING (ADDITIVES); INTERFACES (MATERIALS); MICROGRAVITY PROCESSING; MICROSCOPIC EXAMINATION; SENSORS; SILICON; TEMPERATURE MEASUREMENT;

EID: 0033149096     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(99)00155-4     Document Type: Article
Times cited : (55)

References (28)
  • 19
    • 0009458103 scopus 로고
    • Ph.D. Thesis, University of Freiburg
    • P. Dold, Ph.D. Thesis, University of Freiburg, 1994.
    • (1994)
    • Dold, P.1
  • 21
    • 85031634999 scopus 로고
    • (in Russian).
    • B.M. Turowski, M.G. Milwidski, Phys. Abhandlungen aus der Sowjetunion 6 (1962) 199 (in German) Original in: ΦTT 3 (1961) 2519 (in Russian).
    • (1961) Original in: ΦTT , vol.3 , pp. 2519
  • 26
    • 0003708717 scopus 로고    scopus 로고
    • Fluid Dynamics Inc., Evanston, Illinois
    • M.S. Engelman, Fidap 7.6. Fluid Dynamics Inc., Evanston, Illinois, 1998.
    • (1998) Fidap 7.6.
    • Engelman, M.S.1
  • 27
    • 0009342810 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Freiburg 1998, Shaker Verlag, Aachen
    • Th. Kaiser, Ph.D. Thesis, University of Freiburg 1998, Shaker Verlag, Aachen, 1998.
    • (1998)
    • Kaiser, Th.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.